au.\*:("SPARROW TG")
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A MAGNETIC PRISM SPECTROMETER FOR A HIGH VOLTAGE ELECTRON MICROSCOPE.DARLINGTON EH; SPARROW TG.1975; J. PHYS. E; G.B.; DA. 1975; VOL. 8; NO 7; PP. 596-600; BIBL. 16 REF.Article
APPLICATION OF SCANNING TRANSMISSION ELECTRON MICROSCOPY TO SEMICONDUCTOR DEVICES.SPARROW TG; VALDRE U.1977; PHILOS. MAG.; G.B.; DA. 1977; VOL. 36; NO 6; PP. 1517-1528; BIBL. 25 REF.Article
AN IMPROVED SCANNING SYSTEM FOR A HIGH-VOLTAGE ELECTRON MICROSCOPE.STROJNIK A; SPARROW TG.1977; J. PHYS. E; G.B.; DA. 1977; VOL. 10; NO 5; PP. 502-504; BIBL. 12 REF.Article
OBSERVATION OF DISLOCATIONS AND MICROPLASMA SITES IN SEMICONDUCTORS BY DIRECT CORRELATIONS OF STEBIC, STEM AND ELSFATHY D; SPARROW TG; VALDRE U et al.1980; J. MICR.; GBR; DA. 1980; VOL. 118; NO 3; PP. 263-273; BIBL. 15 REF.Article